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Homepage>CSN EN 60749-17 - Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
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Released: 2003
CSN EN 60749-17 - Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

CSN EN 60749-17

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

CURRENCY
LANGUAGE
English
Number of Standard:CSN EN 60749-17
Category:358799
Released:2003
DESCRIPTION

EN 60749-17


EN 60749-17 Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation - Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.