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Homepage>CSN EN 60749-18 - Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
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Released: 2003
CSN EN 60749-18 - Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

CSN EN 60749-18

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

CURRENCY
LANGUAGE
English
Number of Standard:CSN EN 60749-18
Category:358799
Released:2003
DESCRIPTION

EN 60749-18


EN 60749-18 Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) - Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.

Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.