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Homepage>CSN EN 60749-31 - Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
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Released: 2003
CSN EN 60749-31 - Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

CSN EN 60749-31

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

CURRENCY
LANGUAGE
English
Number of Standard:CSN EN 60749-31
Category:358799
Released:2003
DESCRIPTION

EN 60749-31


EN 60749-31 Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced) - Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.

Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.