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Homepage>CSN EN 60749-32 - Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced)
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Released: 2003
CSN EN 60749-32 - Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced)

CSN EN 60749-32

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced)

CURRENCY
LANGUAGE
English
Number of Standard:CSN EN 60749-32
Category:358799
Released:2003
DESCRIPTION

EN 60749-32


EN 60749-32 Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced) - Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.

Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.