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Homepage>CSN EN 60749-36 - Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
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Released: 2003
CSN EN 60749-36 - Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

CSN EN 60749-36

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

CURRENCY
LANGUAGE
English
Number of Standard:CSN EN 60749-36
Category:358799
Released:2003
DESCRIPTION

EN 60749-36


EN 60749-36 Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state - Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.