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Homepage>CSN EN 60749-5 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
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Released: 2003
CSN EN 60749-5 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

CSN EN 60749-5

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

CURRENCY
LANGUAGE
English
Number of Standard:CSN EN 60749-5
Category:358799
Released:2003
DESCRIPTION

EN 60749-5


EN 60749-5 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test - Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.