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Homepage>CSN EN 60749-8 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
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Released: 2003
CSN EN 60749-8 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

CSN EN 60749-8

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

CURRENCY
LANGUAGE
English
Number of Standard:CSN EN 60749-8
Category:358799
Released:2003
DESCRIPTION

EN 60749-8


EN 60749-8 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing - Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.

Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.