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Homepage>CSN EN 62415 - Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
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Released: 2010
CSN EN 62415 - Semiconductor devices - Constant current electromigration test (IEC 62415:2010)

CSN EN 62415

Semiconductor devices - Constant current electromigration test (IEC 62415:2010)

CURRENCY
LANGUAGE
English
Number of Standard:CSN EN 62415
Category:358771
Released:2010
DESCRIPTION

EN 62415


EN 62415 Semiconductor devices - Constant current electromigration test (IEC 62415:2010) - IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.