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Homepage>CSN EN 62416 - Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
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Released: 2010
CSN EN 62416 - Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)

CSN EN 62416

Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)

CURRENCY
LANGUAGE
English
Number of Standard:CSN EN 62416
Category:358770
Released:2010
DESCRIPTION

EN 62416


EN 62416 Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010) - IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.