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CSN EN 62416
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
|Number of Standard:||CSN EN 62416|
EN 62416 Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010) - IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.